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Conference contributions
300 mm-wafer characterization of ruthenium area-selective deposition in nanoscale line-space and hole patterns
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300 mm-wafer characterization of ruthenium area-selective deposition in nanoscale line-space and hole patterns
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Date
2020
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43161.pdf
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Clerix, Jan-Willem
;
Delabie, Annelies
;
Hung, Joey
;
Warad, L.
;
Shah, Kavita
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2143
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Acq. date: 2025-12-12
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Metrics
Views
2143
since deposited on 2021-10-28
2
last month
Acq. date: 2025-12-12
Citations