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DLTS Study of Electrically Active Defects in semi-vertical GaN-on-Si FETs
Publication:
DLTS Study of Electrically Active Defects in semi-vertical GaN-on-Si FETs
Date
2020
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Drobnŭ, Jakub
;
Marek, Juraj
;
Koza, A.
;
Vadovski, J.
;
Geens, Karen
;
Borga, Matteo
;
Liang, Hu
;
You, Shuzhen
;
Decoutere, Stefaan
;
Stuchlíková, Lubica
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1974
since deposited on 2021-10-28
Acq. date: 2025-10-27
Citations
Metrics
Views
1974
since deposited on 2021-10-28
Acq. date: 2025-10-27
Citations