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Conference contributions
300mm wafer level WS2 p-MOS capacitor characterization, smulation, and analysis
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300mm wafer level WS2 p-MOS capacitor characterization, smulation, and analysis
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Date
2020
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Koladi Mootheri, Vivek
;
Okuyama, Atsushi
;
Smets, Quentin
;
Schram, Tom
;
Asselberghs, Inge
;
Heyns, Marc
;
Radu, Iuliana
;
Lin, Dennis
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2193
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Acq. date: 2026-01-08
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Views
2193
since deposited on 2021-10-28
1
last month
1
last week
Acq. date: 2026-01-08
Citations