dc.contributor.author | Krishtab, Mikhail | |
dc.contributor.author | Hung, Joey | |
dc.contributor.author | Koret, Roy | |
dc.contributor.author | Turovets, Igor | |
dc.contributor.author | Shah, Kavita | |
dc.contributor.author | Rangarajan, Srinivasan | |
dc.contributor.author | Warad, Laxmi | |
dc.contributor.author | Zhang, Vanessa | |
dc.contributor.author | Ameloot, Rob | |
dc.contributor.author | Armini, Silvia | |
dc.date.accessioned | 2021-10-28T23:30:54Z | |
dc.date.available | 2021-10-28T23:30:54Z | |
dc.date.issued | 2020 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/35415 | |
dc.source | IIOimport | |
dc.title | Plasma halogenated amorphous carbon as growth inhibiting layer for area-selective deposition of titanium oxide | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Krishtab, Mikhail | |
dc.contributor.imecauthor | Hung, Joey | |
dc.contributor.imecauthor | Armini, Silvia | |
dc.contributor.orcidimec | Armini, Silvia::0000-0003-0578-3422 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 113250Y | |
dc.source.conference | Metrology, Inspection, and Process Control for Microlithography XXXIV | |
dc.source.conferencedate | 23/02/2020 | |
dc.source.conferencelocation | San Jose, CA USA | |
dc.identifier.url | https://doi.org/10.1117/12.2551492 | |
imec.availability | Published - open access | |
imec.internalnotes | Proceedings of SPIE; Vol. 11325 | |