Publication:
Impacts of through-silicon vias on total-ionizing-dose effects and low-frequency noise in FinFETs
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1978 since deposited on 2021-10-28
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Acq. date: 2026-01-06
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Views
1978 since deposited on 2021-10-28
2last month
2last week
Acq. date: 2026-01-06
Citations