Publication:
Impacts of through-silicon vias on total-ionizing-dose effects and low-frequency noise in FinFETs
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1973 since deposited on 2021-10-28
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Acq. date: 2025-10-24
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Metrics
Views
1973 since deposited on 2021-10-28
451item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations