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Dangling bond defects in silicon-passivated strained-Si1xGex channel layers
Publication:
Dangling bond defects in silicon-passivated strained-Si1xGex channel layers
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Date
2020
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Madia, Oreste
;
Kepa, Jacek
;
Afanas'ev, Valeri
;
Franco, Jacopo
;
Kaczer, Ben
;
Hikavyy, Andriy
;
Stesmans, Andre
Journal
Journal of Materials Science: Materials in Electronics
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1941
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Acq. date: 2025-12-11
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Views
1941
since deposited on 2021-10-29
1
last month
1
last week
Acq. date: 2025-12-11
Citations