Dangling bond defects in silicon-passivated strained-Si1xGex channel layers

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Authors
Madia, Oreste; Kepa, Jacek; Afanas'ev, Valeri; Franco, Jacopo; Kaczer, Ben; Hikavyy, Andriy; Stesmans, Andre
ISSN
0957-4522
Journal
Journal of Materials Science: Materials in Electronics
Volume
31
Title
Dangling bond defects in silicon-passivated strained-Si1xGex channel layers
Publication type
Journal article
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