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Investigation of instrinsic transistor performance of advanced CMOS devices with 2.5 nm NO gate oxides
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Authors
Kubicek, Stefan
;
Henson, W. K.
;
De Keersgieter, An
;
Badenes, Gonçal
;
Jansen, Philippe
;
van Meer, Hans
;
Kerr, Daniel
;
Naem, Abdalla
;
Deferm, Ludo
;
De Meyer, Kristin
Conference
International Electron Devices Meeting. Technical Digest; 5-8 Dec. 1999; Washington, D.C., USA.
Title
Investigation of instrinsic transistor performance of advanced CMOS devices with 2.5 nm NO gate oxides
Publication type
Proceedings paper
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