Publication:
Extensive assessment of the charge-trapping kinetics in InGaAs MOS gate-stacks for the demonstration of improved BTI reliability
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1971 since deposited on 2021-10-29
411item.page.metrics.field.last-week
Acq. date: 2025-10-24
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Metrics
Views
1971 since deposited on 2021-10-29
411item.page.metrics.field.last-week
Acq. date: 2025-10-24
Citations