Publication:
Extensive assessment of the charge-trapping kinetics in InGaAs MOS gate-stacks for the demonstration of improved BTI reliability
Date
Loading...
Journal
Abstract
Description
Metrics
Views
1980 since deposited on 2021-10-29
3last month
2last week
Acq. date: 2026-01-10
Citations
Metrics
Views
1980 since deposited on 2021-10-29
3last month
2last week
Acq. date: 2026-01-10
Citations