Show simple item record

Erase behavior of charge trap flash memory devices using high-k dielectric as blocking oxide liner

dc.contributor.authorRamesh, Siva
dc.contributor.authorAjaykumar, Arjun
dc.contributor.authorBastos, Joao
dc.contributor.authorBreuil, Laurent
dc.contributor.authorArreghini, Antonio
dc.contributor.authorNyns, Laura
dc.contributor.authorSoulie, Jean-Philippe
dc.contributor.authorRagnarsson, Lars-Ake
dc.contributor.authorSchleicher, Filip
dc.contributor.authorJossart, Nico
dc.contributor.authorStiers, Jimmy
dc.contributor.authorVan den Bosch, Geert
dc.contributor.authorRosmeulen, Maarten
dc.date.accessioned2021-10-29T02:44:34Z
dc.date.available2021-10-29T02:44:34Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35801
dc.sourceIIOimport
dc.titleErase behavior of charge trap flash memory devices using high-k dielectric as blocking oxide liner
dc.typeMeeting abstract
dc.contributor.imecauthorRamesh, Siva
dc.contributor.imecauthorAjaykumar, Arjun
dc.contributor.imecauthorBastos, Joao
dc.contributor.imecauthorBreuil, Laurent
dc.contributor.imecauthorArreghini, Antonio
dc.contributor.imecauthorNyns, Laura
dc.contributor.imecauthorSoulie, Jean-Philippe
dc.contributor.imecauthorRagnarsson, Lars-Ake
dc.contributor.imecauthorSchleicher, Filip
dc.contributor.imecauthorJossart, Nico
dc.contributor.imecauthorStiers, Jimmy
dc.contributor.imecauthorVan den Bosch, Geert
dc.contributor.imecauthorRosmeulen, Maarten
dc.contributor.orcidimecRamesh, Siva::0000-0002-8473-7258
dc.contributor.orcidimecBastos, Joao::0000-0002-8877-9850
dc.contributor.orcidimecBreuil, Laurent::0000-0003-2869-1651
dc.contributor.orcidimecArreghini, Antonio::0000-0002-7493-9681
dc.contributor.orcidimecNyns, Laura::0000-0001-8220-870X
dc.contributor.orcidimecSoulie, Jean-Philippe::0000-0002-5956-6485
dc.contributor.orcidimecRagnarsson, Lars-Ake::0000-0003-1057-8140
dc.contributor.orcidimecSchleicher, Filip::0000-0003-3630-7285
dc.contributor.orcidimecVan den Bosch, Geert::0000-0001-9971-6954
dc.contributor.orcidimecRosmeulen, Maarten::0000-0002-3663-7439
dc.source.peerreviewyes
dc.source.beginpage13.4
dc.source.conference51st IEEE Semiconductor Interface Specialists Conference - SISC
dc.source.conferencedate16/12/2020
dc.source.conferencelocationVirtual Conference NA
dc.identifier.urlhttps://www.ieeesisc.org/programs/2020_SISC_technical_program.pdf
imec.availabilityPublished - imec


Files in this item

FilesSizeFormatView

There are no files associated with this item.

This item appears in the following collection(s)

Show simple item record