dc.contributor.author | Ramesh, Siva | |
dc.contributor.author | Ajaykumar, Arjun | |
dc.contributor.author | Bastos, Joao | |
dc.contributor.author | Breuil, Laurent | |
dc.contributor.author | Arreghini, Antonio | |
dc.contributor.author | Nyns, Laura | |
dc.contributor.author | Soulie, Jean-Philippe | |
dc.contributor.author | Ragnarsson, Lars-Ake | |
dc.contributor.author | Schleicher, Filip | |
dc.contributor.author | Jossart, Nico | |
dc.contributor.author | Stiers, Jimmy | |
dc.contributor.author | Van den Bosch, Geert | |
dc.contributor.author | Rosmeulen, Maarten | |
dc.date.accessioned | 2021-10-29T02:44:34Z | |
dc.date.available | 2021-10-29T02:44:34Z | |
dc.date.issued | 2020 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/35801 | |
dc.source | IIOimport | |
dc.title | Erase behavior of charge trap flash memory devices using high-k dielectric as blocking oxide liner | |
dc.type | Meeting abstract | |
dc.contributor.imecauthor | Ramesh, Siva | |
dc.contributor.imecauthor | Ajaykumar, Arjun | |
dc.contributor.imecauthor | Bastos, Joao | |
dc.contributor.imecauthor | Breuil, Laurent | |
dc.contributor.imecauthor | Arreghini, Antonio | |
dc.contributor.imecauthor | Nyns, Laura | |
dc.contributor.imecauthor | Soulie, Jean-Philippe | |
dc.contributor.imecauthor | Ragnarsson, Lars-Ake | |
dc.contributor.imecauthor | Schleicher, Filip | |
dc.contributor.imecauthor | Jossart, Nico | |
dc.contributor.imecauthor | Stiers, Jimmy | |
dc.contributor.imecauthor | Van den Bosch, Geert | |
dc.contributor.imecauthor | Rosmeulen, Maarten | |
dc.contributor.orcidimec | Ramesh, Siva::0000-0002-8473-7258 | |
dc.contributor.orcidimec | Bastos, Joao::0000-0002-8877-9850 | |
dc.contributor.orcidimec | Breuil, Laurent::0000-0003-2869-1651 | |
dc.contributor.orcidimec | Arreghini, Antonio::0000-0002-7493-9681 | |
dc.contributor.orcidimec | Nyns, Laura::0000-0001-8220-870X | |
dc.contributor.orcidimec | Soulie, Jean-Philippe::0000-0002-5956-6485 | |
dc.contributor.orcidimec | Ragnarsson, Lars-Ake::0000-0003-1057-8140 | |
dc.contributor.orcidimec | Schleicher, Filip::0000-0003-3630-7285 | |
dc.contributor.orcidimec | Van den Bosch, Geert::0000-0001-9971-6954 | |
dc.contributor.orcidimec | Rosmeulen, Maarten::0000-0002-3663-7439 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 13.4 | |
dc.source.conference | 51st IEEE Semiconductor Interface Specialists Conference - SISC | |
dc.source.conferencedate | 16/12/2020 | |
dc.source.conferencelocation | Virtual Conference NA | |
dc.identifier.url | https://www.ieeesisc.org/programs/2020_SISC_technical_program.pdf | |
imec.availability | Published - imec | |