Publication:
Erase behavior of charge trap flash memory devices using high-k dielectric as blocking oxide liner
Date
Loading...
Journal
Abstract
Description
Statistics
Views
2216 since deposited on 2021-10-29
21last month
7last week
Acq. date: 2026-04-25
Citations
Statistics
Views
2216 since deposited on 2021-10-29
21last month
7last week
Acq. date: 2026-04-25
Citations