Publication:

Erase behavior of charge trap flash memory devices using high-k dielectric as blocking oxide liner

Date

2020
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Author(s)

Ramesh, Siva  
;
Ajaykumar, Arjun  
;
Bastos, Joao  
;
Breuil, Laurent  
;
Arreghini, Antonio  
;
Nyns, Laura  
;
Soulie, Jean-Philippe  
;
Ragnarsson, Lars-Ake  
;
Schleicher, Filip  
;
Jossart, Nico  
;
Stiers, Jimmy  
;
Van den Bosch, Geert  
;
Rosmeulen, Maarten  

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2218 since deposited on 2021-10-29
9last month
Acq. date: 2026-05-19

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