Publication:
Erase behavior of charge trap flash memory devices using high-k dielectric as blocking oxide liner
Date
Loading...
Journal
Abstract
Description
Metrics
Views
2190 since deposited on 2021-10-29
7last month
1last week
Acq. date: 2026-01-06
Citations
Metrics
Views
2190 since deposited on 2021-10-29
7last month
1last week
Acq. date: 2026-01-06
Citations