Thermal stress-aware CMOS-SRAM partitioning in sequential 3-D technology

Salahuddin, Shairfe Muhammad; Dentoni Litta, Eugenio; Gupta, Anshul; Ritzenthaler, Romain; Schaekers, Marc; Everaert, Jean-Luc; Yu, Hao; Vandooren, Anne; Ryckaert, Julien; Na, Myung Hee; Spessot, Alessio

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Thermal stress-aware CMOS-SRAM partitioning in sequential 3-D technology

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2020

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Salahuddin, Shairfe Muhammad

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Dentoni Litta, Eugenio

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IEEE Transactions on Electron Devices

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Acq. date: 2026-02-25

Thermal stress-aware CMOS-SRAM partitioning in sequential 3-D technology

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