Thermal stress-aware CMOS-SRAM partitioning in sequential 3-D technology

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Authors

Salahuddin, Shairfe Muhammad; Dentoni Litta, Eugenio; Gupta, Anshul; Ritzenthaler, Romain; Schaekers, Marc; Everaert, Jean-Luc; Yu, Hao; Vandooren, Anne; Ryckaert, Julien; Na, Myung Hee; Spessot, Alessio

ISSN

0018-9383

Issue

11

Journal

IEEE Transactions on Electron Devices

Volume

67

Title

Thermal stress-aware CMOS-SRAM partitioning in sequential 3-D technology

Publication type

Journal article

Embargo date

9999-12-31

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