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Materials and defect aspects of III-V and III-N devices for high-speed analog/RF applications
Publication:
Materials and defect aspects of III-V and III-N devices for high-speed analog/RF applications
Date
2020
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Hsu, Brent
;
Yu, Hao
;
Wang, Hongyue
;
Zhao, Ming
;
Takakura, Kenichiro
;
Putcha, Vamsi
;
Peralagu, Uthayasankaran
;
Parvais, Bertrand
;
Waldron, Niamh
;
Collaert, Nadine
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1952
since deposited on 2021-10-29
1
last week
Acq. date: 2025-10-28
Citations
Metrics
Views
1952
since deposited on 2021-10-29
1
last week
Acq. date: 2025-10-28
Citations