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dc.contributor.authorSimoen, Eddy
dc.contributor.authorHsu, Brent
dc.contributor.authorYu, Hao
dc.contributor.authorWang, Hongyue
dc.contributor.authorZhao, Ming
dc.contributor.authorTakakura, Kenichiro
dc.contributor.authorPutcha, Vamsi
dc.contributor.authorPeralagu, Uthayasankaran
dc.contributor.authorParvais, Bertrand
dc.contributor.authorWaldron, Niamh
dc.contributor.authorCollaert, Nadine
dc.date.accessioned2021-10-29T04:09:45Z
dc.date.available2021-10-29T04:09:45Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/35948
dc.sourceIIOimport
dc.titleMaterials and defect aspects of III-V and III-N devices for high-speed analog/RF applications
dc.typeProceedings paper
dc.contributor.imecauthorSimoen, Eddy
dc.contributor.imecauthorHsu, Brent
dc.contributor.imecauthorYu, Hao
dc.contributor.imecauthorWang, Hongyue
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorTakakura, Kenichiro
dc.contributor.imecauthorPutcha, Vamsi
dc.contributor.imecauthorPeralagu, Uthayasankaran
dc.contributor.imecauthorParvais, Bertrand
dc.contributor.imecauthorWaldron, Niamh
dc.contributor.imecauthorCollaert, Nadine
dc.contributor.orcidimecSimoen, Eddy::0000-0002-5218-4046
dc.contributor.orcidimecHsu, Brent::0000-0003-0823-6088
dc.contributor.orcidimecYu, Hao::0000-0002-1976-0259
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecPutcha, Vamsi::0000-0003-1907-5486
dc.contributor.orcidimecPeralagu, Uthayasankaran::0000-0001-9166-4408
dc.contributor.orcidimecParvais, Bertrand::0000-0003-0769-7069
dc.contributor.orcidimecCollaert, Nadine::0000-0002-8062-3165
dc.source.peerreviewyes
dc.source.beginpage316
dc.source.endpage319
dc.source.conference2020 IEEE 15th International Conference on Solid-State and Integrated Circuits Technology - ICSICT 2020
dc.source.conferencedate3/11/2020
dc.source.conferencelocationKunming (online) Chima
imec.availabilityPublished - imec


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