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On the Correlation Between Static and Low-Frequency Noise Parameters of Vertical Nanowire nMOSFETs
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On the Correlation Between Static and Low-Frequency Noise Parameters of Vertical Nanowire nMOSFETs
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Date
2020-05
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Simoen, Eddy
;
Vaisman Chasin, Adrian
;
Matagne, Philippe
;
Rosseel, Erik
;
Hikavyy, Andriy
;
Loo, Roger
;
Favia, Paola
;
Bender, Hugo
;
Vancoille, Eric
;
Horiguchi, Naoto
;
Veloso, Anabela
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1918
since deposited on 2021-10-29
Acq. date: 2025-12-16
Citations
Metrics
Views
1918
since deposited on 2021-10-29
Acq. date: 2025-12-16
Citations