Study of Leakage Mechanisms in III-V Nano-ridge diode on Silicon

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Authors
Syshchyk, Olga; Motsnyi, Vasyl; Puybaret, Renaud; Lee, Jiwon; Karve, Gauri; Puers, Bob; Van Hoof, Chris
Conference
2020 International Conference on Solid States Devices and Materials - SSDM
Title
Study of Leakage Mechanisms in III-V Nano-ridge diode on Silicon
Publication type
Meeting abstract
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