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Study of Leakage Mechanisms in III-V Nano-ridge diode on Silicon

dc.contributor.authorSyshchyk, Olga
dc.contributor.authorMotsnyi, Vasyl
dc.contributor.authorPuybaret, Renaud
dc.contributor.authorLee, Jiwon
dc.contributor.authorKarve, Gauri
dc.contributor.authorPuers, Bob
dc.contributor.authorVan Hoof, Chris
dc.date.accessioned2021-10-29T05:03:00Z
dc.date.available2021-10-29T05:03:00Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36037
dc.sourceIIOimport
dc.titleStudy of Leakage Mechanisms in III-V Nano-ridge diode on Silicon
dc.typeMeeting abstract
dc.contributor.imecauthorSyshchyk, Olga
dc.contributor.imecauthorMotsnyi, Vasyl
dc.contributor.imecauthorPuybaret, Renaud
dc.contributor.imecauthorLee, Jiwon
dc.contributor.imecauthorKarve, Gauri
dc.contributor.imecauthorPuers, Bob
dc.contributor.imecauthorVan Hoof, Chris
dc.contributor.orcidimecMotsnyi, Vasyl::0000-0001-5297-9298
dc.contributor.orcidimecLee, Jiwon::0000-0003-3738-4872
dc.contributor.orcidimecVan Hoof, Chris::1234-1234-1234-1234
dc.source.peerreviewyes
dc.source.beginpageS-5-04
dc.source.conference2020 International Conference on Solid States Devices and Materials - SSDM
dc.source.conferencedate28/09/2020
dc.source.conferencelocationVirtual Japan
dc.identifier.urlhttps://confit.atlas.jp/guide/event/ssdm2020/subject/D-5-04/date?cryptoId=
imec.availabilityPublished - imec


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