Publication:
Low-frequency noise investigation of GaN/AlGaN Metal-Oxide-Semiconductor High-Electron-Mobility Field-Effect-Transistors with different gate length and orientation
Date
Loading...
Journal
Abstract
Description
Statistics
Views
1960 since deposited on 2021-10-29
3last month
2last week
Acq. date: 2026-10-10
Citations
Statistics
Views
1960 since deposited on 2021-10-29
3last month
2last week
Acq. date: 2026-10-10
Citations