Authors

Takakura, Kenichiro; Putcha, Vamsi; Simoen, Eddy; Alian, AliReza; Peralagu, Uthayasankaran; Waldron, Niamh; Parvais, Bertrand; Collaert, Nadine

ISSN

0018-9383

Issue

8

Journal

IEEE Transactions on Electron Devices

Volume

67

Title

Low-frequency noise investigation of GaN/AlGaN Metal-Oxide-Semiconductor High-Electron-Mobility Field-Effect-Transistors with different gate length and orientation

Publication type

Journal article