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Ultrafast RVS as an efficient method to measure oxide breakdown in the EOS and ESD time domain
Publication:
Ultrafast RVS as an efficient method to measure oxide breakdown in the EOS and ESD time domain
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Date
2020
Proceedings Paper
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Van Beek, Simon
;
Simicic, Marko
;
Franco, Jacopo
;
Chen, Shih-Hung
;
Linten, Dimitri
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1799
since deposited on 2021-10-29
Acq. date: 2025-12-16
Citations
Metrics
Views
1799
since deposited on 2021-10-29
Acq. date: 2025-12-16
Citations