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Ultrafast RVS as an efficient method to measure oxide breakdown in the EOS and ESD time domain

dc.contributor.authorVan Beek, Simon
dc.contributor.authorSimicic, Marko
dc.contributor.authorFranco, Jacopo
dc.contributor.authorChen, Shih-Hung
dc.contributor.authorLinten, Dimitri
dc.date.accessioned2021-10-29T05:50:16Z
dc.date.available2021-10-29T05:50:16Z
dc.date.issued2020
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/36115
dc.sourceIIOimport
dc.titleUltrafast RVS as an efficient method to measure oxide breakdown in the EOS and ESD time domain
dc.typeProceedings paper
dc.contributor.imecauthorVan Beek, Simon
dc.contributor.imecauthorSimicic, Marko
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorChen, Shih-Hung
dc.contributor.imecauthorLinten, Dimitri
dc.contributor.orcidimecVan Beek, Simon::0000-0002-2499-4172
dc.contributor.orcidimecSimicic, Marko::0000-0002-3623-1842
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecLinten, Dimitri::0000-0001-8434-1838
dc.source.peerreviewyes
dc.source.conference2020 42nd Annual EOS/ESD Symposium (EOS/ESD)
dc.source.conferencedate13/09/2020
dc.source.conferencelocationReno, NV USA
dc.identifier.urlhttps://ieeexplore.ieee.org/document/9241218
imec.availabilityPublished - imec


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