dc.contributor.author | Leseduarte, S. | |
dc.contributor.author | Marco, S. | |
dc.contributor.author | Beyne, Eric | |
dc.contributor.author | Van Hoof, Rita | |
dc.contributor.author | Marty, A. | |
dc.contributor.author | Pinel, S. | |
dc.contributor.author | Vendier, O. | |
dc.contributor.author | Coello-Vera, A. | |
dc.date.accessioned | 2021-10-14T11:29:34Z | |
dc.date.available | 2021-10-14T11:29:34Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3615 | |
dc.source | IIOimport | |
dc.title | Residual thermo-mechanical stresses in thinned-chip assemblies | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.imecauthor | Van Hoof, Rita | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.beginpage | 306 | |
dc.source.endpage | 311 | |
dc.source.conference | Proceedings of 5th International Workshop on Thermal Investigations of ICs and Microstructures - THERMINIC | |
dc.source.conferencedate | 3/10/1999 | |
dc.source.conferencelocation | Rome Italy | |
imec.availability | Published - open access | |