dc.contributor.author | Vandevelde, Bart | |
dc.contributor.author | Labie, Riet | |
dc.contributor.author | Lauwaert, R. | |
dc.contributor.author | Telizsewski, S. | |
dc.contributor.author | Werkhoven, D. | |
dc.date.accessioned | 2021-10-29T06:41:51Z | |
dc.date.available | 2021-10-29T06:41:51Z | |
dc.date.issued | 2020 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/36199 | |
dc.source | IIOimport | |
dc.title | Improving the QFN Board level Reliability using Low Melting LMPAQ Solder | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.imecauthor | Labie, Riet | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.contributor.orcidimec | Labie, Riet::0000-0002-1401-1291 | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | IEEE Reliability for Electronics and Photonics Packaging Symposium - REPP | |
dc.source.conferencedate | 12/11/2020 | |
dc.source.conferencelocation | virtual virtual | |
imec.availability | Published - open access | |