Interconnect Capacitance Investigation and Optimization Under I/O Pad for ESD Protection of RF/High Speed Circuits in Micro- & Nano-scale CMOS Technology

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Authors
Wu, Wei-Min; Chen, Jie-Ting; Chen, Shih-Hung; Ker, Ming-Dou; Linten, Dimitri; Groeseneken, Guido
Conference
2020 International ESD Workshop (IEW)
Title
Interconnect Capacitance Investigation and Optimization Under I/O Pad for ESD Protection of RF/High Speed Circuits in Micro- & Nano-scale CMOS Technology
Publication type
Proceedings paper
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