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Correlation between pattern density and linewidth variation in silicon photonics waveguides
Publication:
Correlation between pattern density and linewidth variation in silicon photonics waveguides
Date
2020-03
Journal article
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Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Xing, Yufei
;
Dong, Jiaxing
;
Khan, Muhammad Umar
;
Bogaerts, Wim
Journal
Optics Express
Abstract
Description
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Views
1954
since deposited on 2021-10-29
446
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations
Metrics
Views
1954
since deposited on 2021-10-29
446
item.page.metrics.field.last-week
Acq. date: 2025-10-25
Citations