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Plasma impact on the HfO2 high-k dielectric: Continuous-Wave plasma etch versus Quasi-Atomic Layer etch
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Plasma impact on the HfO2 high-k dielectric: Continuous-Wave plasma etch versus Quasi-Atomic Layer etch
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Date
2021
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Radisic, Dunja
;
Smets, Quentin
;
Schram, Tom
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Abstract
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1769
since deposited on 2021-10-31
Acq. date: 2026-01-11
Citations
Metrics
Views
1769
since deposited on 2021-10-31
Acq. date: 2026-01-11
Citations