Authors

Ohyama, Hidenori; Simoen, Eddy; Kuroda, S.; Claeys, Cor; Takami, Y.; Hakata, T.; Sunaga, H.

Conference

Proceedings of the 8th International Autumn Meeting Gettering and Defect Engineering in Semiconductor Technology - GADEST

Title

Radiation induced lattice defects in InGaP/InGaAs P-HEMTs and their effect on device performance

Publication type

Proceedings paper

Embargo date

9999-12-31