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Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects
dc.contributor.author | Nair, Sarath Mohanachandran | |
dc.contributor.author | Bishnoi, Rajendra | |
dc.contributor.author | Tahoori, Mehdi B. | |
dc.contributor.author | Zahedmanesh, Houman | |
dc.contributor.author | Croes, Kristof | |
dc.contributor.author | Garello, Kevin | |
dc.contributor.author | Kar, Gouri Sankar | |
dc.contributor.author | Catthoor, Francky | |
dc.date.accessioned | 2021-11-02T16:05:15Z | |
dc.date.available | 2021-11-02T16:05:15Z | |
dc.date.issued | 2020 | |
dc.identifier.issn | 1541-7026 | |
dc.identifier.other | WOS:000612717200016 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/38200 | |
dc.source | WOS | |
dc.title | Physics based modeling of bimodal electromigration failure distributions and variation analysis for VLSI interconnects | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Zahedmanesh, Houman | |
dc.contributor.imecauthor | Croes, Kristof | |
dc.contributor.imecauthor | Garello, Kevin | |
dc.contributor.imecauthor | Kar, Gouri Sankar | |
dc.contributor.imecauthor | Catthoor, Francky | |
dc.contributor.orcidimec | Garello, Kevin::0000-0003-0236-322X | |
dc.contributor.orcidimec | Croes, Kristof::0000-0002-3955-0638 | |
dc.contributor.orcidimec | Catthoor, Francky::0000-0002-3599-8515 | |
dc.identifier.eisbn | 978-1-7281-3199-3 | |
dc.source.numberofpages | 5 | |
dc.source.peerreview | yes | |
dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
dc.source.conferencedate | APR 28-MAY 30, 2020 | |
imec.availability | Under review |
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