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dc.contributor.authorPerumkunnil, M.
dc.contributor.authorYasin, F.
dc.contributor.authorRao, S.
dc.contributor.authorSalahuddin, S. M.
dc.contributor.authorMilojevic, D.
dc.contributor.authorVan der Plas, G.
dc.contributor.authorRyckaert, J.
dc.contributor.authorBeyne, Eric
dc.contributor.authorFurnemont, A.
dc.contributor.authorKar, G. S.
dc.date.accessioned2021-12-06T02:06:17Z
dc.date.available2021-12-06T02:06:17Z
dc.date.issued2020
dc.identifier.issn2380-9248
dc.identifier.otherWOS:000717011600155
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/38540
dc.sourceWOS
dc.titleSystem exploration and technology demonstration of 3D Wafer-to-Wafer integrated STT-MRAM based caches for advanced Mobile SoCs
dc.typeProceedings paper
dc.contributor.imecauthorPerumkunnil, M.
dc.contributor.imecauthorYasin, F.
dc.contributor.imecauthorRao, S.
dc.contributor.imecauthorSalahuddin, S. M.
dc.contributor.imecauthorMilojevic, D.
dc.contributor.imecauthorVan der Plas, G.
dc.contributor.imecauthorRyckaert, J.
dc.contributor.imecauthorBeyne, Eric
dc.contributor.imecauthorFurnemont, A.
dc.contributor.imecauthorKar, G. S.
dc.contributor.orcidimecBeyne, Eric::0000-0002-3096-050X
dc.identifier.doi10.1109/IEDM13553.2020.9372046
dc.identifier.eisbn978-1-7281-8888-1
dc.source.numberofpages4
dc.source.peerreviewyes
dc.source.conferenceIEEE International Electron Devices Meeting (IEDM)
dc.source.conferencedateDEC 12-18, 2020
imec.availabilityUnder review


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