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System exploration and technology demonstration of 3D Wafer-to-Wafer integrated STT-MRAM based caches for advanced Mobile SoCs
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Authors
Perumkunnil, Manu
;
Yasin, Farrukh
;
Rao, Siddharth
;
Salahuddin, Shairfe Muhammad
;
Milojevic, Dragomir
;
Van der Plas, Geert
;
Ryckaert, Julien
;
Beyne, Eric
;
Furnemont, Arnaud
;
Kar, Gouri Sankar
DOI
10.1109/IEDM13553.2020.9372046
EISBN
978-1-7281-8888-1
ISSN
2380-9248
Conference
IEEE International Electron Devices Meeting (IEDM)
Journal
na
Title
System exploration and technology demonstration of 3D Wafer-to-Wafer integrated STT-MRAM based caches for advanced Mobile SoCs
Publication type
Proceedings paper
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2
20.500.12860/38540.2
*
2022-01-24T10:52:16Z
validation by library/open access desk
1
20.500.12860/38540
2021-12-06T02:06:17Z
*Selected version
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