Publication:

Substrate RF Losses and Non-linearities in GaN-on-Si HEMT Technology

Date

2020

Proceedings Paper

https://doi.org/10.1109/IEDM13553.2020.9371893

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Author(s)

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Cardinael, Pieter

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Vondkar Kodandarama, Komal

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Rodriguez, Raul

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Vermeersch, Bjorn

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Parvais, Bertrand

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Collaert, Nadine

Journal

na

Metrics

2032 since deposited on 2021-12-06

Acq. date: 2026-01-07