Publication:
Temperature-Dependent Electrical Properties of nMOSFETs With Different Thickness Al2O3 Capping Layer and TiN Gate
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1674 since deposited on 2021-12-16
3last month
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Acq. date: 2026-01-07
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Views
1674 since deposited on 2021-12-16
3last month
1last week
Acq. date: 2026-01-07
Citations