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Impact of Structural and Process Variations on the Time-Dependent OFF-State Breakdown of p-GaN Power HEMTs
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Impact of Structural and Process Variations on the Time-Dependent OFF-State Breakdown of p-GaN Power HEMTs
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Date
2021
Journal article
https://doi.org/10.1109/TDMR.2020.3048274
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Millesimo, M.
;
Tallarico, A. N.
;
Posthuma, Niels
;
Bakeroot, Benoit
;
Borga, Matteo
;
Decoutere, Stefaan
Journal
IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY
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1907
since deposited on 2022-02-24
Acq. date: 2025-12-18
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1907
since deposited on 2022-02-24
Acq. date: 2025-12-18
Citations