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Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices
Publication:
Analysis of zero-temperature coefficient behavior on vertically stacked double nanosheet nMOS devices
Date
2021
Journal article
https://doi.org/10.1016/j.mejo.2021.105277
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Coelho, Carlos H. S.
;
Martino, Joao A.
;
Bellodi, Marcello
;
Simoen, Eddy
;
Veloso, Anabela
;
Agopian, Paula G. D.
Journal
MICROELECTRONICS JOURNAL
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1994
since deposited on 2022-03-07
Acq. date: 2025-10-29
Citations
Metrics
Views
1994
since deposited on 2022-03-07
Acq. date: 2025-10-29
Citations