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Vertical stack reliability of GaN-on-Si buffers for low-voltage applications

dc.contributor.authorMeneghini, M.
dc.contributor.authorMeneghesso, G.
dc.contributor.authorZanoni, E.
dc.contributor.authorFabris, Elena
dc.contributor.authorBorga, Matteo
dc.contributor.authorPosthuma, Niels
dc.contributor.authorZhao, Ming
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorYou, Shuzhen
dc.contributor.authorDecoutere, Stefaan
dc.date.accessioned2022-03-11T14:03:10Z
dc.date.available2022-03-11T14:03:10Z
dc.date.issued2021
dc.identifier.issn1541-7026
dc.identifier.otherWOS:000672563100009
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39418
dc.sourceWOS
dc.titleVertical stack reliability of GaN-on-Si buffers for low-voltage applications
dc.typeProceedings paper
dc.contributor.imecauthorFabris, Elena
dc.contributor.imecauthorBorga, Matteo
dc.contributor.imecauthorPosthuma, Niels
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecFabris, E.::0000-0003-1345-5111
dc.contributor.orcidimecBorga, Matteo::0000-0003-3087-6612
dc.contributor.orcidimecPosthuma, Niels::0000-0002-6029-1909
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.identifier.doi10.1109/IRPS46558.2021.9405097
dc.identifier.eisbn978-1-7281-6893-7
dc.source.numberofpages8
dc.source.peerreviewyes
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 21-24, 2021
dc.source.conferencelocationVirtual
dc.source.journalna
imec.availabilityPublished - imec


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