Publication:

Vertical stack reliability of GaN-on-Si buffers for low-voltage applications

Date

2021

Proceedings Paper

https://doi.org/10.1109/IRPS46558.2021.9405097

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Author(s)

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Posthuma, Niels

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De Jaeger, Brice

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Decoutere, Stefaan

Journal

na

Metrics

1895 since deposited on 2022-03-11

Acq. date: 2025-12-11