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Vertical stack reliability of GaN-on-Si buffers for low-voltage applications
Publication:
Vertical stack reliability of GaN-on-Si buffers for low-voltage applications
Date
2021
Proceedings Paper
https://doi.org/10.1109/IRPS46558.2021.9405097
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APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Meneghini, M.
;
Meneghesso, G.
;
Zanoni, E.
;
Fabris, Elena
;
Borga, Matteo
;
Posthuma, Niels
;
Zhao, Ming
;
De Jaeger, Brice
;
You, Shuzhen
;
Decoutere, Stefaan
Journal
na
Abstract
Description
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1892
since deposited on 2022-03-11
Acq. date: 2025-10-23
Citations
Metrics
Views
1892
since deposited on 2022-03-11
Acq. date: 2025-10-23
Citations