Publication:

Vertical stack reliability of GaN-on-Si buffers for low-voltage applications

Date

2021
Proceedings Paper
https://doi.org/10.1109/IRPS46558.2021.9405097
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dc.contributor.authorMeneghini, M.
dc.contributor.authorMeneghesso, G.
dc.contributor.authorZanoni, E.
dc.contributor.authorFabris, Elena
dc.contributor.authorBorga, Matteo
dc.contributor.authorPosthuma, Niels
dc.contributor.authorZhao, Ming
dc.contributor.authorDe Jaeger, Brice
dc.contributor.authorYou, Shuzhen
dc.contributor.authorDecoutere, Stefaan
dc.contributor.imecauthorFabris, Elena
dc.contributor.imecauthorBorga, Matteo
dc.contributor.imecauthorPosthuma, Niels
dc.contributor.imecauthorZhao, Ming
dc.contributor.imecauthorDe Jaeger, Brice
dc.contributor.imecauthorYou, Shuzhen
dc.contributor.imecauthorDecoutere, Stefaan
dc.contributor.orcidimecFabris, E.::0000-0003-1345-5111
dc.contributor.orcidimecBorga, Matteo::0000-0003-3087-6612
dc.contributor.orcidimecPosthuma, Niels::0000-0002-6029-1909
dc.contributor.orcidimecZhao, Ming::0000-0002-0856-851X
dc.contributor.orcidimecDe Jaeger, Brice::0000-0001-8804-7556
dc.contributor.orcidimecDecoutere, Stefaan::0000-0001-6632-6239
dc.date.accessioned2022-03-11T14:03:10Z
dc.date.available2022-03-11T14:03:10Z
dc.date.issued2021
dc.identifier.doi10.1109/IRPS46558.2021.9405097
dc.identifier.eisbn978-1-7281-6893-7
dc.identifier.issn1541-7026
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39418
dc.publisherIEEE
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 21-24, 2021
dc.source.conferencelocationVirtual
dc.source.journalna
dc.source.numberofpages8
dc.subject.keywordsLEAKAGE CURRENT
dc.subject.keywordsSILICON
dc.title

Vertical stack reliability of GaN-on-Si buffers for low-voltage applications

dc.typeProceedings paper
dspace.entity.typePublication
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