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The properties, effect and extraction of localized defect profiles from degraded FET characteristics

dc.contributor.authorVandemaele, Michiel
dc.contributor.authorKaczer, Ben
dc.contributor.authorTyaginov, Stanislav
dc.contributor.authorFranco, Jacopo
dc.contributor.authorDegraeve, Robin
dc.contributor.authorVaisman Chasin, Adrian
dc.contributor.authorWu, Zhicheng
dc.contributor.authorBury, Erik
dc.contributor.authorXiang, Yang
dc.contributor.authorMertens, Hans
dc.contributor.authorGroeseneken, Guido
dc.date.accessioned2022-03-11T14:49:59Z
dc.date.available2022-03-11T14:49:59Z
dc.date.issued2021
dc.identifier.issn1541-7026
dc.identifier.otherWOS:000672563100075
dc.identifier.urihttps://imec-publications.be/handle/20.500.12860/39426
dc.sourceWOS
dc.titleThe properties, effect and extraction of localized defect profiles from degraded FET characteristics
dc.typeProceedings paper
dc.contributor.imecauthorVandemaele, Michiel
dc.contributor.imecauthorKaczer, Ben
dc.contributor.imecauthorTyaginov, Stanislav
dc.contributor.imecauthorFranco, Jacopo
dc.contributor.imecauthorDegraeve, Robin
dc.contributor.imecauthorVaisman Chasin, Adrian
dc.contributor.imecauthorWu, Zhicheng
dc.contributor.imecauthorBury, Erik
dc.contributor.imecauthorXiang, Yang
dc.contributor.imecauthorMertens, Hans
dc.contributor.imecauthorGroeseneken, Guido
dc.contributor.orcidimecVandemaele, Michiel::0000-0003-0740-4115
dc.contributor.orcidimecKaczer, Ben::0000-0002-1484-4007
dc.contributor.orcidimecFranco, Jacopo::0000-0002-7382-8605
dc.contributor.orcidimecBury, Erik::0000-0002-5847-3949
dc.contributor.orcidimecXiang, Yang::0000-0003-0091-6935
dc.contributor.orcidimecGroeseneken, Guido::0000-0003-3763-2098
dc.contributor.orcidimecVaisman Chasin, Adrian::0000-0002-9940-0260
dc.identifier.doi10.1109/IRPS46558.2021.9405164
dc.identifier.eisbn978-1-7281-6893-7
dc.source.numberofpages7
dc.source.peerreviewyes
dc.source.conferenceIEEE International Reliability Physics Symposium (IRPS)
dc.source.conferencedateMAR 21-24, 2021
dc.source.conferencelocationVirtual
dc.source.journalna
imec.availabilityPublished - imec


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