Publication:

The properties, effect and extraction of localized defect profiles from degraded FET characteristics

Date

2021
Proceedings Paper
https://doi.org/10.1109/IRPS46558.2021.9405164
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Author(s)

Vandemaele, Michiel  
;
Kaczer, Ben  
;
Tyaginov, Stanislav  
;
Franco, Jacopo  
;
Degraeve, Robin  
;
Vaisman Chasin, Adrian  
;
Wu, Zhicheng  
;
Bury, Erik  
;
Xiang, Yang  
;
Mertens, Hans  
;
Groeseneken, Guido  

Journal

na

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1940 since deposited on 2022-03-11
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Acq. date: 2026-02-27

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