Publication:
The properties, effect and extraction of localized defect profiles from degraded FET characteristics
| dc.contributor.author | Vandemaele, Michiel | |
| dc.contributor.author | Kaczer, Ben | |
| dc.contributor.author | Tyaginov, Stanislav | |
| dc.contributor.author | Franco, Jacopo | |
| dc.contributor.author | Degraeve, Robin | |
| dc.contributor.author | Vaisman Chasin, Adrian | |
| dc.contributor.author | Wu, Zhicheng | |
| dc.contributor.author | Bury, Erik | |
| dc.contributor.author | Xiang, Yang | |
| dc.contributor.author | Mertens, Hans | |
| dc.contributor.author | Groeseneken, Guido | |
| dc.contributor.imecauthor | Vandemaele, Michiel | |
| dc.contributor.imecauthor | Kaczer, Ben | |
| dc.contributor.imecauthor | Tyaginov, Stanislav | |
| dc.contributor.imecauthor | Franco, Jacopo | |
| dc.contributor.imecauthor | Degraeve, Robin | |
| dc.contributor.imecauthor | Vaisman Chasin, Adrian | |
| dc.contributor.imecauthor | Wu, Zhicheng | |
| dc.contributor.imecauthor | Bury, Erik | |
| dc.contributor.imecauthor | Xiang, Yang | |
| dc.contributor.imecauthor | Mertens, Hans | |
| dc.contributor.imecauthor | Groeseneken, Guido | |
| dc.contributor.orcidimec | Vandemaele, Michiel::0000-0003-0740-4115 | |
| dc.contributor.orcidimec | Kaczer, Ben::0000-0002-1484-4007 | |
| dc.contributor.orcidimec | Franco, Jacopo::0000-0002-7382-8605 | |
| dc.contributor.orcidimec | Bury, Erik::0000-0002-5847-3949 | |
| dc.contributor.orcidimec | Xiang, Yang::0000-0003-0091-6935 | |
| dc.contributor.orcidimec | Groeseneken, Guido::0000-0003-3763-2098 | |
| dc.contributor.orcidimec | Vaisman Chasin, Adrian::0000-0002-9940-0260 | |
| dc.date.accessioned | 2022-03-11T14:49:59Z | |
| dc.date.available | 2022-03-11T14:49:59Z | |
| dc.date.issued | 2021 | |
| dc.identifier.doi | 10.1109/IRPS46558.2021.9405164 | |
| dc.identifier.eisbn | 978-1-7281-6893-7 | |
| dc.identifier.issn | 1541-7026 | |
| dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39426 | |
| dc.publisher | IEEE | |
| dc.source.conference | IEEE International Reliability Physics Symposium (IRPS) | |
| dc.source.conferencedate | MAR 21-24, 2021 | |
| dc.source.conferencelocation | Virtual | |
| dc.source.journal | na | |
| dc.source.numberofpages | 7 | |
| dc.subject.keywords | DEGRADATION | |
| dc.subject.keywords | PERFORMANCE | |
| dc.subject.keywords | CHARGES | |
| dc.subject.keywords | VOLTAGE | |
| dc.subject.keywords | MOSFETS | |
| dc.title | The properties, effect and extraction of localized defect profiles from degraded FET characteristics | |
| dc.type | Proceedings paper | |
| dspace.entity.type | Publication | |
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