Publication:

The properties, effect and extraction of localized defect profiles from degraded FET characteristics

Date

2021

Proceedings Paper

https://doi.org/10.1109/IRPS46558.2021.9405164

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Author(s)

Vandemaele, Michiel

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Tyaginov, Stanislav

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Degraeve, Robin

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Vaisman Chasin, Adrian

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Groeseneken, Guido

Journal

na

Statistics

1940 since deposited on 2022-03-11

Acq. date: 2026-04-07