Skip to content
Institutional repository
Communities & Collections
Browse
Site
Log In
imec Publications
Articles
A ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/III-V semiconductor Schottky barrier contacts by chemical pretreatments
Publication:
A ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/III-V semiconductor Schottky barrier contacts by chemical pretreatments
Date
1999
Journal article
Simple item page
Full metadata
Statistics
Loading...
Loading...
Files
3912.pdf
146.28 KB
Basic data
APA
Chicago
Harvard
IEEE
Basic data
APA
Chicago
Harvard
IEEE
Author(s)
Vanalme, G. M.
;
Goubert, L.
;
Van Meirhaeghe, R. L.
;
Cardon, F.
;
Van Daele, Peter
Journal
Semiconductor Science and Technology
Abstract
Description
Metrics
Views
1932
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations
Metrics
Views
1932
since deposited on 2021-10-14
Acq. date: 2025-10-23
Citations