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A ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/III-V semiconductor Schottky barrier contacts by chemical pretreatments
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1936 since deposited on 2021-10-14
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Acq. date: 2026-01-08
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1936 since deposited on 2021-10-14
1last month
1last week
Acq. date: 2026-01-08
Citations