Authors

Vanalme, G. M.; Goubert, L.; Van Meirhaeghe, R. L.; Cardon, F.; Van Daele, Peter

Issue

9

Journal

Semiconductor Science and Technology

Volume

14

Title

A ballistic electron emission microscopy study of barrier height inhomogeneities introduced in Au/III-V semiconductor Schottky barrier contacts by chemical pretreatments

Publication type

Journal article

Embargo date

9999-12-31