dc.contributor.author | Chery, Emmanuel | |
dc.contributor.author | Slabbekoorn, John | |
dc.contributor.author | Pinho, Nelson | |
dc.contributor.author | Miller, Andy | |
dc.contributor.author | Beyne, Eric | |
dc.date.accessioned | 2022-03-16T14:56:03Z | |
dc.date.available | 2022-03-16T14:56:03Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0569-5503 | |
dc.identifier.other | WOS:000702282700053 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39461 | |
dc.source | WOS | |
dc.title | Advances in Photosensitive Polymer Based Damascene RDL Processes: Toward Submicrometer Pitches With More Metal Layers | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Chery, Emmanuel | |
dc.contributor.imecauthor | Slabbekoorn, John | |
dc.contributor.imecauthor | Miller, Andy | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.orcidimec | Chery, Emmanuel::0000-0002-2526-3873 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.identifier.doi | 10.1109/ECTC32696.2021.00064 | |
dc.identifier.eisbn | 978-0-7381-4523-5 | |
dc.source.numberofpages | 7 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 340 | |
dc.source.endpage | 346 | |
dc.source.conference | IEEE 71st Electronic Components and Technology Conference (ECTC) | |
dc.source.conferencedate | JUN 01-JUL 04, 2021 | |
dc.source.conferencelocation | Virtual | |
dc.source.journal | na | |
imec.availability | Published - imec | |