dc.contributor.author | Vandevelde, Bart | |
dc.contributor.author | Beyne, Eric | |
dc.contributor.author | Van Puymbroeck, Jan | |
dc.contributor.author | Heerman, M. | |
dc.date.accessioned | 2021-10-14T11:51:17Z | |
dc.date.available | 2021-10-14T11:51:17Z | |
dc.date.issued | 1999 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/3967 | |
dc.source | IIOimport | |
dc.title | Effect on thermal fatigue reliability of decreasing the pitch of PSGA packages from 0.8 to 0.3 mm | |
dc.type | Oral presentation | |
dc.contributor.imecauthor | Vandevelde, Bart | |
dc.contributor.imecauthor | Beyne, Eric | |
dc.contributor.imecauthor | Van Puymbroeck, Jan | |
dc.contributor.orcidimec | Vandevelde, Bart::0000-0002-6753-6438 | |
dc.contributor.orcidimec | Beyne, Eric::0000-0002-3096-050X | |
dc.date.embargo | 9999-12-31 | |
dc.source.peerreview | no | |
dc.source.conference | Area Array Packaging Technologies Workshop | |
dc.source.conferencedate | 15/11/1999 | |
dc.source.conferencelocation | Berlin Germany | |
imec.availability | Published - open access | |