Ab-intio based electron-phonon scattering for 2D materials within the NEGF framework

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Authors
Gaddemane, Gautam; Duflou, Rutger; Sankaran, Kiroubanand; Pourtois, Geoffrey; Houssa, Michel; Afzalian, Aryan
DOI
10.1109/SISPAD54002.2021.9592532
EISBN
978-1-6654-0685-7
ISSN
1946-1569
Conference
International Conference on Simulation of Semiconductor Processes and Devices (SISPAD)
Journal
na
Title
Ab-intio based electron-phonon scattering for 2D materials within the NEGF framework
Publication type
Proceedings paper
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