Notice
This item has not yet been validated by imec staff.
Notice
This is not the latest version of this item. The latest version can be found at: https://imec-publications.be/handle/20.500.12860/39751.3
Wafer-Level LICCDM Device Testing
dc.contributor.author | Simicic, Marko | |
dc.contributor.author | Wu, Wei-Min | |
dc.contributor.author | Claes, Dieter | |
dc.contributor.author | Tamura, Shinichi | |
dc.contributor.author | Shimada, Yohei | |
dc.contributor.author | Sawada, Masanori | |
dc.contributor.author | Chen, Shih-Hung | |
dc.date.accessioned | 2022-05-05T02:17:41Z | |
dc.date.available | 2022-05-05T02:17:41Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 0739-5159 | |
dc.identifier.other | WOS:000786179000028 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39751 | |
dc.source | WOS | |
dc.title | Wafer-Level LICCDM Device Testing | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simicic, Marko | |
dc.contributor.imecauthor | Wu, Wei-Min | |
dc.contributor.imecauthor | Claes, Dieter | |
dc.contributor.imecauthor | Chen, Shih-Hung | |
dc.contributor.orcidimec | Simicic, Marko::0000-0002-3623-1842 | |
dc.identifier.eisbn | 978-1-58537-329-1 | |
dc.source.numberofpages | 8 | |
dc.source.peerreview | yes | |
dc.source.conference | 43rd Annual EOS/ESD Symposium (EOS/ESD) | |
dc.source.conferencedate | SEP 26-OCT 01, 2021 | |
dc.source.conferencelocation | Tucson | |
imec.availability | Under review |
Files in this item
Files | Size | Format | View |
---|---|---|---|
There are no files associated with this item. |