dc.contributor.author | Rawat, Amita | |
dc.contributor.author | Bhuwalka, Krishna K. | |
dc.contributor.author | Matagne, Philippe | |
dc.contributor.author | Vermeersch, Bjorn | |
dc.contributor.author | Wu, Hao | |
dc.contributor.author | Hellings, Geert | |
dc.contributor.author | Ryckaert, Julien | |
dc.contributor.author | Liu, Changze | |
dc.date.accessioned | 2022-08-26T08:42:23Z | |
dc.date.available | 2022-05-15T02:18:26Z | |
dc.date.available | 2022-08-16T09:36:11Z | |
dc.date.available | 2022-08-26T08:42:23Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 1930-8876 | |
dc.identifier.other | WOS:000790809500010 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39820.3 | |
dc.source | WOS | |
dc.title | Performance Trade-Off Scenarios for GAA Nanosheet FETs Considering Inner-spacers and Epi-induced Stress: Understanding & Mitigating Process Risks | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Rawat, Amita | |
dc.contributor.imecauthor | Matagne, Philippe | |
dc.contributor.imecauthor | Vermeersch, Bjorn | |
dc.contributor.imecauthor | Hellings, Geert | |
dc.contributor.imecauthor | Ryckaert, Julien | |
dc.contributor.orcidimec | Vermeersch, Bjorn::0000-0001-8640-672X | |
dc.contributor.orcidimec | Hellings, Geert::0000-0002-5376-2119 | |
dc.identifier.doi | 10.1109/ESSDERC53440.2021.9631815 | |
dc.identifier.eisbn | 978-1-6654-3748-6 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.beginpage | 55 | |
dc.source.endpage | 58 | |
dc.source.conference | IEEE 51st European Solid-State Device Research Conference (ESSDERC) | |
dc.source.conferencedate | SEP 06-09, 2021 | |
dc.source.conferencelocation | Grenoble, France | |
dc.source.journal | Proceedings of IEEE 51st European Solid-State Device Research Conference (ESSDERC) | |
imec.availability | Published - imec | |