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High Temperature Influence on the Trade-off between gm/I-D and f(T) of nanosheet NMOS Transistors with Different Metal Gate Stack
dc.contributor.author | Silva, Vanessa C. P. | |
dc.contributor.author | Martino, Joao A. | |
dc.contributor.author | Simoen, Eddy | |
dc.contributor.author | Veloso, Anabela | |
dc.contributor.author | Agopian, Paula G. D. | |
dc.date.accessioned | 2022-05-19T02:21:24Z | |
dc.date.available | 2022-05-19T02:21:24Z | |
dc.date.issued | 2021 | |
dc.identifier.issn | 2330-5738 | |
dc.identifier.other | WOS:000790181800015 | |
dc.identifier.uri | https://imec-publications.be/handle/20.500.12860/39839 | |
dc.source | WOS | |
dc.title | High Temperature Influence on the Trade-off between gm/I-D and f(T) of nanosheet NMOS Transistors with Different Metal Gate Stack | |
dc.type | Proceedings paper | |
dc.contributor.imecauthor | Simoen, Eddy | |
dc.contributor.imecauthor | Veloso, Anabela | |
dc.contributor.orcidimec | Simoen, Eddy::0000-0002-5218-4046 | |
dc.identifier.doi | 10.1109/EuroSOI-ULIS53016.2021.9560185 | |
dc.identifier.eisbn | 978-1-6654-3745-5 | |
dc.source.numberofpages | 4 | |
dc.source.peerreview | yes | |
dc.source.conference | Joint International EUROSOI Workshop / International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS) | |
dc.source.conferencedate | SEP 01-03, 2021 | |
dc.source.conferencelocation | Caen | |
imec.availability | Under review |
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