EISBN
978-1-6654-3745-5
ISSN
2330-5738
Conference
Joint International EUROSOI Workshop / International Conference on Ultimate Integration on Silicon (EuroSOI-ULIS)
Journal
na
Title
High Temperature Influence on the Trade-off between gm/I-D and f(T) of nanosheet NMOS Transistors with Different Metal Gate Stack
Publication type
Proceedings paper