Danger, high voltage! Using EEG and EOG measurements for cognitive overload detection in a simulated industrial context

Morton, Jessica; Zheleva, Aleksandra; Van Acker, Bram; Durnez, Wouter; Vanneste, Pieter; Larmuseau, Charlotte; De Bruyne, Jonas; Raes, Annelies; Cornillie, Frederik; Saldien, Jelle; De Marez, Lieven; Bombeke, Klaas

doi:10.1016/j.apergo.2022.103763

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Danger, high voltage! Using EEG and EOG measurements for cognitive overload detection in a simulated industrial context

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2022

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https://doi.org/10.1016/j.apergo.2022.103763

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APPLIED ERGONOMICS

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1680 since deposited on 2022-06-11

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Acq. date: 2026-01-11

Danger, high voltage! Using EEG and EOG measurements for cognitive overload detection in a simulated industrial context

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